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Atomic Force Microscopy Measurements of PEM Fuel Cells Processes
January 2005 - December 2007 (completed)
Investigators
Peter M. Pinsky, Mechanical Engineering; David M. Barnett, Materials
Science and Engineering and Mechanical Engineering, Stanford University
Annual Reports
Publications
- Shen, Y., D. M. Barnett, and P. M. Pinsky, Modeling electrostatic force microscopy for conductive and dielectric samples using the boundary element method: Eng. Anal. Bound. Elem., accepted for publication.
- Shen, Y., D. M. Barnett, and P. M. Pinsky, Analytic perturbation solution to the capacitance system between a hyberboloidal tip and a rough surface: Appl. Phys. Lett., 92, 134105, 2008.
- Shen, Y., D. M. Barnett, and P. M. Pinsky, Simulating and interpreting Kelvin probe force microscopy images on dielectrics with boundary integral equations: Rev. Sci. Instrum., 79, 023711, 2008.
- Shen, Y., M. Lee, W. Lee, D. M. Barnett, P. M. Pinsky, and F. B. Prinz, A resolution study for electrostatic force microscopy on bimetallic samples using the boundary element method: Nanotechnology, 19, 035710, 2008.
- Shen, Y., D. M. Barnett, and P. M. Pinsky. “Integral equation modeling of electrostatic interactions in atomic force microscopy.” In: Integral Methods in Science and Engineering: Techniques and Applications (C. Constanda and S. Potapenko eds.), Birkhäuser, Boston, pp. 237-246, (2007).
Updated October 2009
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